Temperature-dependence of Threshold Current Density-Length Product in Metallization Lines: A Revisit

Rahmat Saptono, Choong Un Kim

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)


One of the important phenomena in Electromigration (EM) is Blech Effect. The existence of Threshold Current Density-Length Product or EM Threshold has such fundamental and technological consequences in the design, manufacture, and testing of electronics. Temperature-dependence of Blech Product had been thermodynamically established and the real behavior of such interconnect materials have been extensively studied. The present paper reviewed the temperature-dependence of EM threshold in metallization lines of different materials and structure as found in relevant published articles. It is expected that the reader can see a big picture from the compiled data, which might be overlooked when it was examined in pieces.

Original languageEnglish
Article number12044
JournalJournal of Physics: Conference Series
Issue number1
Publication statusPublished - 5 May 2016
Event4th International Conference on Science and Engineering in Mathematics, Chemistry and Physics 2016, ScieTech 2016 - Bali, Indonesia
Duration: 30 Jan 201631 Jan 2016


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