We report on the deposition by Langmuir-Blodgett process of monolayer Tetraether lipids films were transferred onto Silicon wafer substrates. Langmuir experiments were performed with the Langmuir trough from a commercial film balance (Riegler & Kirstein GmbH, Mainz, Germany). The surface pressure was measured with a filter paper Wilhelmy balance. The experiments were performed at a temperature of 19°C ± 1°C. The subphase was pure water. The Tetraetherlipid were dissolved in chloroform in concentration 1 mMol for the film balance experiments. Ellipsometry Measurements show that the thickness and optical properties of monolayer films, The thickness by Ellipsometry were represent a combined mean value of domains about 1,5 nm - 4, 0 nm. The surface morphology with Atomic Force Microscoy (AFM) as results showed that in all films domains are present and that the thickness of the observed domains films varies between 2 nm and 5 nm. From all films the hydrophobically transferred showed the most homogeneous organization on the substrates. After transfer on hydrophilic and amino silanisated surfaces the lipids are arranged in small islands on the substrates.