Structural analysis and dielectric properties of La1-xBixFeO3 perovskite materials at room temperature

S. N. Fitria, D. Triyono

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Abstract

Perovskites La1-xBixFeO3 (x = 0.1, 0.3, and 0.5) were prepared by sol-gel method. Structural characterization was performed by X-Ray diffraction (XRD) and X-Ray Fluorescence (XRF). Based on refinement results of XRD analysis, the samples shown the single phase orthorhombic structure with Pnma space group. The dielectric constant and loss factor of the bulk samples were investigated by using LCR-Meter in the frequency range of 100 Hz-1 MHz at room temperature. Increasing Bi content caused decreasing dielectric constant. It may be correlated with decreasing the density of sample with Bi-doped.

Original languageEnglish
Article number012071
JournalJournal of Physics: Conference Series
Volume1153
Issue number1
DOIs
Publication statusPublished - 26 Feb 2019
Event9th International Conference on Physics and Its Applications, ICOPIA 2018 - Surakarta, Indonesia
Duration: 14 Aug 201814 Aug 2018

Fingerprint

Dive into the research topics of 'Structural analysis and dielectric properties of La1-xBixFeO3 perovskite materials at room temperature'. Together they form a unique fingerprint.

Cite this