Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film

Djati Handoko; Je Ho Shim; Dong Hyun Kim; Tae Kyu Kim; Jaehun Park

doi:10.1007/978-3-319-07743-7_99

Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film

Djati Handoko, Je Ho Shim, Dong Hyun Kim, Tae Kyu Kim, Jaehun Park

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Diffraction imaging using X-ray has been attracting huge attention for possible application to investigate ultrafast magnetism. In this work, the sequential changes of Fraunhofer diffraction pattern due to photo-induced nonlinear refractive index changes in a transparent magnetooptic thin film were observed by using the 4f imaging system with phase objects at the entrance aperture. The selection of the aperture shape was observed numerically. We also discussed the power distribution of the temporally observed patterns.

Original language	English
Title of host publication	Ultrafast Magnetism I - Proceedings of the International Conference, UMC 2013
Editors	Roy Chantrell, Jean-Yves Bigot, Wolfgang Hübner, Theo Rasing
Publisher	Springer Science and Business Media, LLC
Pages	320-322
Number of pages	3
ISBN (Electronic)	9783319077420
DOIs	https://doi.org/10.1007/978-3-319-07743-7_99
Publication status	Published - 1 Jan 2015
Event	International Conference on Ultrafast Magnetism, UMC 2013 - Strasbourg, France Duration: 28 Oct 2013 → 1 Nov 2013

Publication series

Name	Springer Proceedings in Physics
Volume	159
ISSN (Print)	0930-8989
ISSN (Electronic)	1867-4941

Conference

Conference	International Conference on Ultrafast Magnetism, UMC 2013
Country	France
City	Strasbourg
Period	28/10/13 → 1/11/13

Access to Document

10.1007/978-3-319-07743-7_99

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Handoko, D., Shim, J. H., Kim, D. H., Kim, T. K., & Park, J. (2015). Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film. In R. Chantrell, J-Y. Bigot, W. Hübner, & T. Rasing (Eds.), Ultrafast Magnetism I - Proceedings of the International Conference, UMC 2013 (pp. 320-322). (Springer Proceedings in Physics; Vol. 159). Springer Science and Business Media, LLC. https://doi.org/10.1007/978-3-319-07743-7_99

Handoko, Djati ; Shim, Je Ho ; Kim, Dong Hyun ; Kim, Tae Kyu ; Park, Jaehun. / Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film. Ultrafast Magnetism I - Proceedings of the International Conference, UMC 2013. editor / Roy Chantrell ; Jean-Yves Bigot ; Wolfgang Hübner ; Theo Rasing. Springer Science and Business Media, LLC, 2015. pp. 320-322 (Springer Proceedings in Physics).

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title = "Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film",

abstract = "Diffraction imaging using X-ray has been attracting huge attention for possible application to investigate ultrafast magnetism. In this work, the sequential changes of Fraunhofer diffraction pattern due to photo-induced nonlinear refractive index changes in a transparent magnetooptic thin film were observed by using the 4f imaging system with phase objects at the entrance aperture. The selection of the aperture shape was observed numerically. We also discussed the power distribution of the temporally observed patterns.",

author = "Djati Handoko and Shim, {Je Ho} and Kim, {Dong Hyun} and Kim, {Tae Kyu} and Jaehun Park",

year = "2015",

month = jan,

day = "1",

doi = "10.1007/978-3-319-07743-7_99",

language = "English",

series = "Springer Proceedings in Physics",

publisher = "Springer Science and Business Media, LLC",

pages = "320--322",

editor = "Roy Chantrell and Jean-Yves Bigot and Wolfgang H{\"u}bner and Theo Rasing",

booktitle = "Ultrafast Magnetism I - Proceedings of the International Conference, UMC 2013",

note = "International Conference on Ultrafast Magnetism, UMC 2013 ; Conference date: 28-10-2013 Through 01-11-2013",

}

Handoko, D, Shim, JH, Kim, DH, Kim, TK & Park, J 2015, Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film. in R Chantrell, J-Y Bigot, W Hübner & T Rasing (eds), Ultrafast Magnetism I - Proceedings of the International Conference, UMC 2013. Springer Proceedings in Physics, vol. 159, Springer Science and Business Media, LLC, pp. 320-322, International Conference on Ultrafast Magnetism, UMC 2013, Strasbourg, France, 28/10/13. https://doi.org/10.1007/978-3-319-07743-7_99

Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film. / Handoko, Djati; Shim, Je Ho; Kim, Dong Hyun; Kim, Tae Kyu; Park, Jaehun.

Ultrafast Magnetism I - Proceedings of the International Conference, UMC 2013. ed. / Roy Chantrell; Jean-Yves Bigot; Wolfgang Hübner; Theo Rasing. Springer Science and Business Media, LLC, 2015. p. 320-322 (Springer Proceedings in Physics; Vol. 159).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - Diffraction imaging using X-ray has been attracting huge attention for possible application to investigate ultrafast magnetism. In this work, the sequential changes of Fraunhofer diffraction pattern due to photo-induced nonlinear refractive index changes in a transparent magnetooptic thin film were observed by using the 4f imaging system with phase objects at the entrance aperture. The selection of the aperture shape was observed numerically. We also discussed the power distribution of the temporally observed patterns.

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Handoko D, Shim JH, Kim DH, Kim TK, Park J. Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film. In Chantrell R, Bigot J-Y, Hübner W, Rasing T, editors, Ultrafast Magnetism I - Proceedings of the International Conference, UMC 2013. Springer Science and Business Media, LLC. 2015. p. 320-322. (Springer Proceedings in Physics). https://doi.org/10.1007/978-3-319-07743-7_99

Magnetic-field-dependent fraunhofer diffraction pattern by 4f imaging system in transparent magnetooptic thin film

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