TY - JOUR
T1 - Identification of malignant skin cancer using back-propagation learning with Karhunen-Loeve transformation
AU - Putro, Benyamin Kusumo
AU - Palupi, Mayasari T.
AU - Arymurthy, Aniati Murni
PY - 2000
Y1 - 2000
N2 - Malignant melanoma is the deadliest form of cancer, fortunately, if it is detected early, even this type of cancer may be treated successfully. In this paper, we present a neural network approach for the automated separation of melanoma from benign categories of cancer, which exhibit melanoma-like characteristics. To reduce the computational complexities, while increasing the possibility of not being trapped in local minima of the back-propagation neural network, we applied Karhunen-Loeve transformation technique to the originally training patterns. We also utilized a cross entropy error function between the output and the target patterns. Using this approach, for reasonably balance of training/testing set, about 94% of correct classification of malignant and benign cancers could be obtained.
AB - Malignant melanoma is the deadliest form of cancer, fortunately, if it is detected early, even this type of cancer may be treated successfully. In this paper, we present a neural network approach for the automated separation of melanoma from benign categories of cancer, which exhibit melanoma-like characteristics. To reduce the computational complexities, while increasing the possibility of not being trapped in local minima of the back-propagation neural network, we applied Karhunen-Loeve transformation technique to the originally training patterns. We also utilized a cross entropy error function between the output and the target patterns. Using this approach, for reasonably balance of training/testing set, about 94% of correct classification of malignant and benign cancers could be obtained.
UR - http://www.scopus.com/inward/record.url?scp=0033739414&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0033739414
SN - 0277-786X
VL - 4043
SP - 381
EP - 386
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Optical Pattern Recognition XI
Y2 - 26 April 2000 through 27 April 2000
ER -