High-temperature electrical properties of LaFe1-xTixO3 (x = 0.4, 0.5, 0.6)

D. Y. Jufri, D. Triyono, H. Laysandra

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1 Citation (Scopus)

Abstract

We report herein the high-temperature electrical properties of perovskite LaFe1-xTix,O3 with x = 0.4, 0.5, 0.6. All samples were synthesized by using the sol-gel method, and the electrical properties were investigated by using impedance spectroscopy in the frequency range of 100 Hz-1 MHz and at temperatures ranging from 348 to 548 K. Nyquist plots show a decrease in impedance with decreasing Ti content and the diameter of the Nyquist plot impedance semicircle decreases with increasing temperature. The dielectric constant increases with increasing temperature until reaches 105 at 548 K. In addition, the dielectric relaxation phenomenon appears at all temperatures. Finally, we used scanning electron microscopy to study morphology, grain size, and grain distribution of these materials. The average grain size is 360-370 nm and increases with increasing Ti content.

Original languageEnglish
Article number012026
JournalIOP Conference Series: Materials Science and Engineering
Volume496
Issue number1
DOIs
Publication statusPublished - 22 Feb 2019
Event2nd International Conference on Current Progress in Functional Materials 2017, ISCPFM 2017 - Bali, Indonesia
Duration: 8 Nov 20179 Nov 2017

Keywords

  • electrical properties
  • LaFeTiO
  • perovskite
  • sol-gel

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