Growing barium hexaferrite (BaFe12O19) thin films using chemical solution deposition

Sri Budiawanti, Bambang Soegijono

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Barium hexaferrite (BaFe12O19, or simply known as BaM) thin films has been recognized as a potential candidate for microwave-based devices, magnetic recording media and data storage. To grow BaM thin films, chemical solution deposition is conducted using the aqueous solution of metal nitrates, which involves spin coatings on Si substrates. Furthermore, Thermal Gravimeter Analysis (TGA), X-Ray Diffractometer (XRD), Scanning Electron Microscopy (SEM) and Vibrating Sample Magnetometer (VSM) are applied to evaluate the decomposition behavior, structure, morphology, and magnetic properties of BaM thin films. Additionally, the effects of number of layers variation are also investigated. Finally, magnetic properties analysis indicates the isotropic nature of the films.

Original languageEnglish
Title of host publicationInternational Symposium on Current Progress in Mathematics and Sciences 2015, ISCPMS 2015
Subtitle of host publicationProceedings of the 1st International Symposium on Current Progress in Mathematics and Sciences
EditorsTerry Mart, Djoko Triyono
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735413764
DOIs
Publication statusPublished - 19 Apr 2016
Event1st International Symposium on Current Progress in Mathematics and Sciences, ISCPMS 2015 - Depok, Indonesia
Duration: 3 Nov 20154 Nov 2015

Publication series

NameAIP Conference Proceedings
Volume1729
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference1st International Symposium on Current Progress in Mathematics and Sciences, ISCPMS 2015
Country/TerritoryIndonesia
CityDepok
Period3/11/154/11/15

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