@inproceedings{200bca42fdf54502a76e85735fae24f8,
title = "Electrical capacitance volume tomography simulation on 64 channel capacitive sensor by comparing the two scanning methods",
abstract = "This paper describe process tomography based on capacitance measurement namely Electrical Capacitance Volume Tomography (ECVT). The capacitance tomography is used for imaging object from capacitive sensor. The simulation has been done by designing 64 channels capacitive sensor to reconstruct three spheres of objects by applying conventional combination and full combination scanning methods. Data were collected by means of changing the position of three spherical phantoms inside capacitive sensor in various positions. Then the image reconstruction result is compared with actual object to obtain the correlation of the image. Quantitative assessment shows that the average value of correlation coefficient (CC) is 0.45 while the average of mean absolute error (MAE) is 0.1. As visually seen, the image reconstruction from simulation process of 64 channels capacitive sensor has successfully reconstructed three object spheres arranged in row. This work proves that image reconstruction from full combination scanning has a good image compared with conventional combination scanning, as shown with higher mean absolute error (MAE) and lower coefficient- correlation (CC).",
keywords = "Electrical Capacitance Volume Tomography, capacitive sensor, scanning method",
author = "Arbai Yusuf and Savira Ramadhanty and Dodi Sudiana and Tamsir, {Agus Santoso} and S., {Harry Sudibyo}",
year = "2018",
month = jan,
day = "9",
doi = "10.1109/ICELTICS.2017.8253268",
language = "English",
series = "Proceedings - 2017 International Conference on Electrical Engineering and Informatics: Advancing Knowledge, Research, and Technology for Humanity, ICELTICs 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "57--60",
booktitle = "Proceedings - 2017 International Conference on Electrical Engineering and Informatics",
address = "United States",
note = "2017 International Conference on Electrical Engineering and Informatics, ICELTICs 2017 ; Conference date: 18-10-2017 Through 20-10-2017",
}