TY - JOUR
T1 - Effect of ultrasonic processing on the d-spacing of natural zeolite
AU - Prasetyo, T. A.B.
AU - Soegijono, B.
N1 - Publisher Copyright:
© 2019 Published under licence by IOP Publishing Ltd.
PY - 2019/4/16
Y1 - 2019/4/16
N2 - The crystal geometry characteristics of sonicated Bayah natural zeolite using X-Ray diffraction (XRD) method has been studied. High intensity ultrasonic waves were exposed to the samples for 40 minutes, 80 minutes and 120 minutes. Rietveld analysis of X-Ray diffraction was conducted to evaluate effect of ultrasonic processing to the shifting of d-spacing each sample. Higher shifting d-spacing 0.01 up to 0.03 Å found at ZA40 sample and lowest shifting found at ZA80 sample 0.003 up to 0.007 Å. Relationship between sonification process with shifting of d-spacing are close relationship with duration of applied high intensity ultrasonic process resulted in crystallite morphology due to changes of O-H binding.
AB - The crystal geometry characteristics of sonicated Bayah natural zeolite using X-Ray diffraction (XRD) method has been studied. High intensity ultrasonic waves were exposed to the samples for 40 minutes, 80 minutes and 120 minutes. Rietveld analysis of X-Ray diffraction was conducted to evaluate effect of ultrasonic processing to the shifting of d-spacing each sample. Higher shifting d-spacing 0.01 up to 0.03 Å found at ZA40 sample and lowest shifting found at ZA80 sample 0.003 up to 0.007 Å. Relationship between sonification process with shifting of d-spacing are close relationship with duration of applied high intensity ultrasonic process resulted in crystallite morphology due to changes of O-H binding.
UR - http://www.scopus.com/inward/record.url?scp=85065568062&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/1191/1/012046
DO - 10.1088/1742-6596/1191/1/012046
M3 - Conference article
AN - SCOPUS:85065568062
SN - 1742-6588
VL - 1191
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012046
T2 - 4th International Symposium on Frontier of Applied Physics, ISFAP 2018
Y2 - 1 November 2018 through 2 November 2018
ER -