TY - GEN
T1 - Double layer microwave absorption characteristics of barium hexaferrite/silica composite for x-band frequencies
AU - Handoko, Erfan
AU - Sugihartono, Iwan
AU - Marpaung, Mangasi Alion
AU - Randa, Maulana
AU - Alaydrus, Mudrik
AU - Sofyan, Nofrijon
N1 - Publisher Copyright:
© 2018 Trans Tech Publications, Switzerland.
PY - 2018
Y1 - 2018
N2 - Microwave absorption characteristics of double layer of barium hexaferrite attached on the silica to from a composite on the basis of wave propagation theory have been investigated. Barium hexaferrite, BaFe12 O19, was synthesized through ceramic method from stoichiometric mixtures of BaCO3 and Fe2 O3 as precursors. The mixture was pelletized under the pressure of 10 MPa and sintered at 1100 °C for 5 hours. Silica in the forms of powder was purified by using HCl. The crystal structure of the samples was characterized using X-ray diffraction (XRD), microstructure was examined using scanning electron microscope (SEM), hysteresis curves recorded by PERMAGRAPH techniques, whereas the microwave absorbing properties for X-band was recorded using a vector network analyzer (VNA). Relative complex permeability and permittivity, and reflection loss values were calculated at given thickness according to transmittance line theory within the range 8.2–12.4 GHz. Based on this study, the layer dimension and frequency that results in low reflection loss can be estimated from the material properties of the barium hexaferrite/silica composite material.
AB - Microwave absorption characteristics of double layer of barium hexaferrite attached on the silica to from a composite on the basis of wave propagation theory have been investigated. Barium hexaferrite, BaFe12 O19, was synthesized through ceramic method from stoichiometric mixtures of BaCO3 and Fe2 O3 as precursors. The mixture was pelletized under the pressure of 10 MPa and sintered at 1100 °C for 5 hours. Silica in the forms of powder was purified by using HCl. The crystal structure of the samples was characterized using X-ray diffraction (XRD), microstructure was examined using scanning electron microscope (SEM), hysteresis curves recorded by PERMAGRAPH techniques, whereas the microwave absorbing properties for X-band was recorded using a vector network analyzer (VNA). Relative complex permeability and permittivity, and reflection loss values were calculated at given thickness according to transmittance line theory within the range 8.2–12.4 GHz. Based on this study, the layer dimension and frequency that results in low reflection loss can be estimated from the material properties of the barium hexaferrite/silica composite material.
KW - Barium hexaferrite
KW - Microwave absorber
KW - Radar-absorbing material
KW - Reflection loss
KW - Silica
UR - http://www.scopus.com/inward/record.url?scp=85055488470&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.929.109
DO - 10.4028/www.scientific.net/MSF.929.109
M3 - Conference contribution
AN - SCOPUS:85055488470
SN - 9783035712667
T3 - Materials Science Forum
SP - 109
EP - 115
BT - Advanced Materials Research - QiR 15
A2 - Yatim, Ardiyansyah
PB - Trans Tech Publications Ltd
T2 - 15th International Conference on Quality in Research, QiR 2017
Y2 - 24 July 2017 through 27 July 2017
ER -