Diffraction and interference pattern by 4f imaging system to determine the thin film magnetic properties

Determine the magnetic properties of thin film material using X-ray has been attracting enormous attention in recent years. In this work, we propose a simple method to determine base on 4F imaging system. The narrow slit is applied to produce diffraction pattern in the X-ray scale. The slit width variation is applied to numerically obeserve the Fraunhofer diffraction pattern sequential changes. To demonstrate the sensitivity of the method, the power distribution of the temporal observed patterns was also measured. The selection of the object shape also discussed for comprehensive discussion.