Diffraction and interference pattern by 4f imaging system to determine the thin film magnetic properties

F. Nauval, P. S. Febie, H. S. Lukman, S. Arief, Djati Handoko

Research output: Contribution to journalConference articlepeer-review

Abstract

Determine the magnetic properties of thin film material using X-ray has been attracting enormous attention in recent years. In this work, we propose a simple method to determine base on 4F imaging system. The narrow slit is applied to produce diffraction pattern in the X-ray scale. The slit width variation is applied to numerically obeserve the Fraunhofer diffraction pattern sequential changes. To demonstrate the sensitivity of the method, the power distribution of the temporal observed patterns was also measured. The selection of the object shape also discussed for comprehensive discussion.

Original languageEnglish
Article number012054
JournalJournal of Physics: Conference Series
Volume1317
Issue number1
DOIs
Publication statusPublished - 11 Nov 2019
Event3rd International Conference on Mathematics, Sciences, Education, and Technology, ICOMSET 2018 - Padang, West Sumatra, Indonesia
Duration: 4 Oct 20185 Oct 2018

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