Cyclic shift resolution effects on OFDM system employing cyclic-SLM with delayed correlation and matched filter

Panca Dewi Pamungkasari, Yukitoshi Sanada, Filbert H. Juwono, Dadang Gunawan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Large peak-to-average power ratio (PAPR) is the major issue in orthogonal frequency-division multiplexing (OFDM) systems. Selective mapping (SLM) has been commonly employed to reduce the PAPR. However, SLM requires side information (SI) which reduce the bandwidth efficiency. A low-complexity cyclic SLM (C-SLM) scheme without SI which uses delay correlation and matched filter, called C-SLM-DC-MF, has been proposed in the literature. This paper examines the effects of cyclic shift resolution of the OFDM system with C-SLM-DC-MF scheme on the system performance, in terms of PAPR reduction, accuracy, and bit error rate (BER). Simulation results show that higher resolution leads to lower PAPR reduction but better accuracy and BER performance.

Original languageEnglish
Title of host publicationTENCON 2017 - 2017 IEEE Region 10 Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages153-157
Number of pages5
ISBN (Electronic)9781509011339
DOIs
Publication statusPublished - 19 Dec 2017
Event2017 IEEE Region 10 Conference, TENCON 2017 - Penang, Malaysia
Duration: 5 Nov 20178 Nov 2017

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
Volume2017-December
ISSN (Print)2159-3442
ISSN (Electronic)2159-3450

Conference

Conference2017 IEEE Region 10 Conference, TENCON 2017
CountryMalaysia
CityPenang
Period5/11/178/11/17

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Keywords

  • OFDM
  • PAPR
  • cyclic shift
  • delayed correlation
  • matched filter

Cite this

Pamungkasari, P. D., Sanada, Y., Juwono, F. H., & Gunawan, D. (2017). Cyclic shift resolution effects on OFDM system employing cyclic-SLM with delayed correlation and matched filter. In TENCON 2017 - 2017 IEEE Region 10 Conference (pp. 153-157). (IEEE Region 10 Annual International Conference, Proceedings/TENCON; Vol. 2017-December). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.2017.8227853