Coverage of Radio Wave Propagation at UI Campus Surrounding Using Ray Tracing and Physical Optics Near to Far Field Method

Salman Zahid Fathurrahman, Eko Tjipto Rahardjo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In the last few years the demands of communication and data transfer are growing rapidly. To achieve good signal quality and to increase data transfer speed, the site specific model in wireless communication is used to analyze the effect of geographical condition. In this paper we discussed the propagation model based on ray tracing and physical optics with near-to-far field method, in urban area modeling by considering the influence on transmitter height at 800 MHz, 2.3 GHz, and 38 GHz. The simulation was carried out for our campus area to model urban area. The result obtained from the simulation shows the path loss value increases as the transmitter's height and the frequency increases. Path loss exponents obtained from urban areas model in line of sight condition are range from 1.8-2.2.

Original languageEnglish
Title of host publicationProceedings of TENCON 2018 - 2018 IEEE Region 10 Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1123-1126
Number of pages4
ISBN (Electronic)9781538654576
DOIs
Publication statusPublished - 22 Feb 2019
Event2018 IEEE Region 10 Conference, TENCON 2018 - Jeju, Korea, Republic of
Duration: 28 Oct 201831 Oct 2018

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
Volume2018-October
ISSN (Print)2159-3442
ISSN (Electronic)2159-3450

Conference

Conference2018 IEEE Region 10 Conference, TENCON 2018
CountryKorea, Republic of
CityJeju
Period28/10/1831/10/18

Keywords

  • path loss
  • path loss exponent
  • physical optic
  • ray tracing
  • site specific model

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    Fathurrahman, S. Z., & Rahardjo, E. T. (2019). Coverage of Radio Wave Propagation at UI Campus Surrounding Using Ray Tracing and Physical Optics Near to Far Field Method. In Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference (pp. 1123-1126). [8650480] (IEEE Region 10 Annual International Conference, Proceedings/TENCON; Vol. 2018-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.2018.8650480