Annealing-temperature dependence of the electrical properties of Ba0.8Pb0.2TiO3 as a PTC material

D. Triyono; A. Akbar; H. Laysandra

doi:10.1088/1742-6596/1442/1/012012

Annealing-temperature dependence of the electrical properties of Ba_0.8Pb_0.2TiO₃ as a PTC material

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this research, we investigate how the annealing temperature affects the electrical properties of Ba_0.8Pb_0.2TiO₃ as a positive temperature coefficient material. The material was synthesized via solid-state sintering. The grain size was varied by varying the annealing temperature between 850 °C and 1000 °C for 4 h. Characterization via X-ray diffraction showed that a single-phase compound was formed exhibiting a tetragonal phase. The microstructure was observed using scanning electron microscopy. Average grain size was observed to be between 5 and 10μm. The electrical properties as characterized using impedance spectroscopy showed the presence of grain and grain-boundary contributions in the annealed samples. Dielectric constant and dielectric relaxation phenomenon as a function of annealing temperature have been studied.

Original language	English
Article number	012012
Journal	Journal of Physics: Conference Series
Volume	1442
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/1442/1/012012
Publication status	Published - 29 Jan 2020
Event	Basic and Applied Sciences Interdisciplinary Conference 2017, BASIC 2017 - , Indonesia Duration: 18 Aug 2017 → 19 Aug 2017

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title = "Annealing-temperature dependence of the electrical properties of Ba0.8Pb0.2TiO3 as a PTC material",

abstract = "In this research, we investigate how the annealing temperature affects the electrical properties of Ba0.8Pb0.2TiO3 as a positive temperature coefficient material. The material was synthesized via solid-state sintering. The grain size was varied by varying the annealing temperature between 850 °C and 1000 °C for 4 h. Characterization via X-ray diffraction showed that a single-phase compound was formed exhibiting a tetragonal phase. The microstructure was observed using scanning electron microscopy. Average grain size was observed to be between 5 and 10μm. The electrical properties as characterized using impedance spectroscopy showed the presence of grain and grain-boundary contributions in the annealed samples. Dielectric constant and dielectric relaxation phenomenon as a function of annealing temperature have been studied.",

author = "D. Triyono and A. Akbar and H. Laysandra",

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T1 - Annealing-temperature dependence of the electrical properties of Ba0.8Pb0.2TiO3 as a PTC material

AU - Triyono, D.

AU - Akbar, A.

AU - Laysandra, H.

PY - 2020/1/29

Y1 - 2020/1/29

N2 - In this research, we investigate how the annealing temperature affects the electrical properties of Ba0.8Pb0.2TiO3 as a positive temperature coefficient material. The material was synthesized via solid-state sintering. The grain size was varied by varying the annealing temperature between 850 °C and 1000 °C for 4 h. Characterization via X-ray diffraction showed that a single-phase compound was formed exhibiting a tetragonal phase. The microstructure was observed using scanning electron microscopy. Average grain size was observed to be between 5 and 10μm. The electrical properties as characterized using impedance spectroscopy showed the presence of grain and grain-boundary contributions in the annealed samples. Dielectric constant and dielectric relaxation phenomenon as a function of annealing temperature have been studied.

AB - In this research, we investigate how the annealing temperature affects the electrical properties of Ba0.8Pb0.2TiO3 as a positive temperature coefficient material. The material was synthesized via solid-state sintering. The grain size was varied by varying the annealing temperature between 850 °C and 1000 °C for 4 h. Characterization via X-ray diffraction showed that a single-phase compound was formed exhibiting a tetragonal phase. The microstructure was observed using scanning electron microscopy. Average grain size was observed to be between 5 and 10μm. The electrical properties as characterized using impedance spectroscopy showed the presence of grain and grain-boundary contributions in the annealed samples. Dielectric constant and dielectric relaxation phenomenon as a function of annealing temperature have been studied.

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U2 - 10.1088/1742-6596/1442/1/012012

DO - 10.1088/1742-6596/1442/1/012012

M3 - Conference article

AN - SCOPUS:85079675178

VL - 1442

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

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T2 - Basic and Applied Sciences Interdisciplinary Conference 2017, BASIC 2017

Y2 - 18 August 2017 through 19 August 2017

ER -

Annealing-temperature dependence of the electrical properties of Ba_0.8Pb_0.2TiO₃ as a PTC material

Abstract

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