@inproceedings{5a2fe013debd49e690ec0408eb8a59df,
title = "4f imaging system method to determine optical properties of thin film magnetic material",
abstract = "In recent years, X-ray has been attracting enormous attention as a tool to determine the magnetic properties of thin film material. We have constructed a simple method base on 4F imaging system to determine analytically optical properties of thin film material. Very small narrow slit is applied to yield diffraction and interference pattern in the X-ray scale. It was found that the sequential changes of Fraunhofer diffraction pattern due to slit width variation. Sensitivity of the method was validated by measuring the power distribution of the temporal observed patterns. The object shape was also varied for comprehensive discussion.",
author = "Nauval Franata and Sari, {Febie Permata} and Lukman Hakim and Arief Sudarmaji and Handoyo and Djati Handoko",
note = "Publisher Copyright: {\textcopyright} 2019 Author(s).; International Conference on Science and Applied Science 2019, ICSAS 2019 ; Conference date: 20-07-2019",
year = "2019",
month = dec,
day = "27",
doi = "10.1063/1.5141642",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "A. Suparmi and Nugraha, {Dewanta Arya}",
booktitle = "International Conference on Science and Applied Science, ICSAS 2019",
}