4f imaging system method to determine optical properties of thin film magnetic material

Nauval Franata, Febie Permata Sari, Lukman Hakim, Arief Sudarmaji, Handoyo, Djati Handoko

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In recent years, X-ray has been attracting enormous attention as a tool to determine the magnetic properties of thin film material. We have constructed a simple method base on 4F imaging system to determine analytically optical properties of thin film material. Very small narrow slit is applied to yield diffraction and interference pattern in the X-ray scale. It was found that the sequential changes of Fraunhofer diffraction pattern due to slit width variation. Sensitivity of the method was validated by measuring the power distribution of the temporal observed patterns. The object shape was also varied for comprehensive discussion.

Original languageEnglish
Title of host publicationInternational Conference on Science and Applied Science, ICSAS 2019
EditorsA. Suparmi, Dewanta Arya Nugraha
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735419537
DOIs
Publication statusPublished - 27 Dec 2019
EventInternational Conference on Science and Applied Science 2019, ICSAS 2019 - Surakarta, Indonesia
Duration: 20 Jul 2019 → …

Publication series

NameAIP Conference Proceedings
Volume2202
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceInternational Conference on Science and Applied Science 2019, ICSAS 2019
CountryIndonesia
CitySurakarta
Period20/07/19 → …

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