FEI Tecnai G2 SuperTwin TEM/STEM

    Facility/equipment: Equipment

    • Location

      Jalan Professor Doktor Nugroho Notosutanto, Pondok Cina, Beji

      Gedung Integrated Laboratory & Research Center (ILRC) Kampus UI, Lt. Dasar

      Depok

      16424

      Indonesia

    Description

    The Tecnai G2 SuperTwin TEM/STEM is capable of imaging at atomic resolution, the microscope is optimised for high-performance microanalysis by EDAX energy-dispersive X-ray spectroscopy (EDX). The Titan is equipped with a CCD camera and STEM detectors for high angle annular dark field (HAADF) STEM imaging. 3D imaging is also possible using FEI's Xplore3D tomography package for automated acquisition, reconstruction and visualisation of tomographic data.

    Techniques:

    - A 200 kV scanning and transmission TEM for analytical nanostructure analysis.
    - Brightfield and darkfield imaging
    - Electron diffraction
    - High resolution TEM
    - Scanning transmission electron microscopy (STEM), including high angle annular dark field (HAADF) modes
    - Energy-dispersive X-ray spectroscopy (EDX) – point mode and mapping
    - Tomography for 3D reconstructions

    Fingerprint

    transmission electron microscopy
    scanning electron microscopy
    tomography
    Titan
    microanalysis
    CCD cameras
    spectroscopy
    acquisition
    x rays
    electron diffraction
    microscopes
    scanning
    energy
    high resolution
    detectors